X-ray fluorescence analyzer (XRF) is an instrument used for element analysis, which can determine the type and content of elements in a sample. The working principle of XRF is based on the fact that when X-rays are irradiated on a sample, atoms in the sample emit fluorescence of specific energy, which can be detected and converted into information for element recognition.

When X-rays are irradiated on the sample, the atoms in the sample are excited, and the inner electrons are pushed to higher energy levels, resulting in vacancies. When external electrons fill these gaps, they release characteristic X-rays corresponding to specific elements, namely fluorescence. By measuring the energy and intensity of these fluorescence, the type and content of elements in the sample can be inferred.

X-ray fluorescence analyzers are widely used in various fields, including geological exploration, materials science, environmental protection, life sciences, etc. They can be used to analyze various samples such as soil, rocks, minerals, metals, semiconductor materials, polymers, biological tissues, etc. The advantages of XRF include non-destructive analysis, speed, wide range of analyte elements (from Na to U), and relatively low detection limits.